Design, Production Test, and Yield
The Test and Measurement World Resource Center provides you with access to Design, Production Test and Yield documents and various other papers such as Circuit Board Guides, Test Design PDFs, Semiconductor Notes and more.
Application Note: Complex test setups with many instruments take time to set up, and in the end, you cannot be sure how they influence your test results. The versatile 4-in-1 Agilent 81160A pulse function arbitrary noise generator addresses noise and jitter emulation, Ethernet, SATA, radar, and nanotechnology... more
Application Note: Smaller pads not only utilize less device real estate, they also allow sacrificial test structures to be placed in scribe lines, meaning process control monitoring and device characterization can be performed without using valuable space for sellable circuits. When trying to probe pad sizes of 50... more
Webcast: As modular instruments become the preferred choice for automated test systems, where should readers begin as they integrate multiple platforms (PXI, VXI, AXIe) with traditional box instruments (LXI) into hybrid test systems? Join T&MW's Alan Earls and a panel of experts to learn more... more
Webcast: Engineers don't necessarily need the ultimate in bandwidth. For many applications, scopes having bandwidths in the low-gigahertz range perform fine, but what readers really require are easy-to-use instruments that get results fast. Test & Measurement World Contributing Editor Alan Earls hosts a... more
White Paper: Traditionally, it has been up to the design-for-test (DFT) engineer to understand the test strategy and implement the DFT associated with it. DFT engineers now have a guide so they can effectively and efficiently test designs that include the ARM Cortex-A15 processor... more
Webcast: Flash EEPROM and serial EEPROM devices can be found on almost every electronics product today. In the past, such devices have most commonly been programmed before being mounted on a printed circuit board assembly (PCBA), but these devices are increasingly being programmed in-situ after being... more
Introducing the Next Generation of Test Automation & Interoperability – the NTAF Specification
Network Test Automation Forum
Webcast: As networks become more complex, testing of network equipment requires multiple tools. Automation is frequently employed as a strategy to orchestrate the diverse test environment, but to date there have been no standards for tools to work together in a coordinated solution. The Network Test... more
Webcast: Find out what is happening in LXI, the Test and Measurement standard for Ethernet control, and how the vendors are ensuring products conform to the standard. Discover how LXI is setting its evolutionary path of following the migration of Ethernet and IVI standards... more
Webcast: Hardware-in-the-loop (HIL) simulation has become increasingly important in the development and test of complex real-time embedded systems. It is attractive because it adds the complexity of the plant under control to the test platform and that complexity is then included in test and development by... more
eBook: From components to systems, flexible and powerful automated test equipment can help get your products to market quickly. The editors of Test & Measurement World have handpicked a series of valuable ATE articles for this special eBOOK Edition. Sponsored by: Chroma Systems Solutions... more
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